| Tariff Item | Description of Goods | Units of Measure [1] | MFN Tariff [2] | Applicable Preferential Tariffs [3] |
|---|---|---|---|---|
| 9031.4 | Other optical instruments and appliances: | |||
| 9031.41.00 | For inspecting semiconductor wafers or devices or for inspecting photomasks or reticles used in manufacturing semiconductor devices | Free | CCCT, LDCT, GPT, UST, MT, MUST, CIAT, CT, CRT, IT, NT, SLT, PT: Free | |
| 9031.41.00.10 | For inspecting semiconductor wafers | NMB | Free | |
| 9031.41.00.20 | For inspecting semiconductor devices except wafers | NMB | Free | |
| 9031.41.00.30 | For inspecting photomasks used in manufacturing semiconductor devices | NMB | Free | |
| 9031.41.00.40 | For inspecting reticles used in manufacturing semiconductor devices | NMB | Free |
For the latest tariff rate, please refer to CBSA [4]
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